Romanian Journal of Information Science and Technology (ROMJIST)

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ROMJIST is a publication of Romanian Academy,
Section for Information Science and Technology

Editor – in – Chief:

Academician Dan Dascalu

Secretariate (office):
Adriana Apostol
Adress for correspondence: romjist@nano-link.net (after 1st of January, 2019)

Editing of the printed version: Mihaela Marian (Publishing House of the Romanian Academy, Bucharest)

Technical editor
of the on-line version:
Lucian Milea (University POLITEHNICA of Bucharest)

Sponsors:
• National Institute for R & D
in Microtechnologies
(IMT Bucharest), www.imt.ro
• Association for Generic
and Industrial Technologies (ASTEGI), www.astegi.ro

ROMJIST Volume 22, No. 1, 2019, pp. 69-84, Paper no. 619/2019
 

Ines Hurez, Ted Chen, Florin Vlădoianu, Vlad Anghel, Gheorghe Brezeanu
Galvanically Isolated IGBT Gate Driver with Advanced Protections and A Fault Detection and Reporting Method

ABSTRACT: This paper presents a method for detecting and reporting fault signals that can occur in the normal functionality of galvanically isolated Insulated Gate Bipolar Transistor (IGBT) gate drivers with advanced protection circuits. The method provides robust transmission of Under Voltage Lock Out (UVLO) and Desaturation (DESAT) events, while the protection methods, such as soft shutdown and Active Miller Clamp (AMC), prevent improper functionality that can damage the IGBT. The technique introduces a block that prioritizes and encodes the error signals in a manner that allows area and cost minimization, as well as reducing the power consumption of the gate driver. The proposed circuit was verified by means of simulations, and implemented in a standard 0.25μm CMOS BCD technology, as part of a galvanically isolated IGBT gate driver. Experimental results highlight proper reporting of UVLO/DESAT faults and validate the functionality of the protection functions.

KEYWORDS: Active Miller Clamp, desaturation, galvanic isolation, gate driver, IGBT, soft shutdown, Under Voltage Lock Out

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