Romanian Journal of Information Science and Technology (ROMJIST)

An open – access publication

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ROMJIST is a publication of Romanian Academy,
Section for Information Science and Technology

Editor – in – Chief:
Radu-Emil Precup

Honorary Co-Editors-in-Chief:
Horia-Nicolai Teodorescu
Gheorghe Stefan

Secretariate (office):
Adriana Apostol
Adress for correspondence: romjist@nano-link.net (after 1st of January, 2019)

Founding Editor-in-Chief
(until 10th of February, 2021):
Dan Dascalu

Editing of the printed version: Mihaela Marian (Publishing House of the Romanian Academy, Bucharest)

Technical editor
of the on-line version:
Lucian Milea (University POLITEHNICA of Bucharest)

Sponsor:
• National Institute for R & D
in Microtechnologies
(IMT Bucharest), www.imt.ro

ROMJIST Volume 27, No. 2, 2024, pp. 217-228, DOI: 10.59277/ROMJIST.2024.2.08
 

Alex CALINESCU, Marius ENACHESCU, Alexandru ANTONESCU, Sorin COTOFANA
8-bit Dynamic Element Matching based Feedback Controller Applied to an Instrumentation Amplifier

ABSTRACT: The instrumentation amplifier, which incorporates Dynamic Element Matching (DEM) and a resistive network, utilizes a digital controller to reduce gain error by means of averaging. In this paper, we assess the feasibility of combining, within a general-purpose microcontroller, the appealing DEM, i.e., very accurate resistive ratios ranging between 1 and 15, with the associated versatile and scalable interrupt-aware digital controller. Given a mixed-signal system, a hybrid evaluation environment has been developed to perform relevant test-benches for assessing the system’s performance, i.e., DEM controller, muxes, OpAmps, with respect to relevant metrics for integrated digital and mixed-signal circuits, i.e., energy, delay, footprint, precision. When implementing our design in a commercial 180nm technology, the gain precision of a typical amplifier is improved by more than 1800 times, with the error converging to as low as 10s of ppm, for Gaussian mismatch distribution between -1% and 1% with the cost of DEM digital circuitry which adds about 30000 µm2 of chip area and will consume 194 µA.

KEYWORDS: Dynamic Element Matching; digital controller; gain error; instrumentation amplifier; mismatch

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