Romanian Journal of Information Science and Technology (ROMJIST)

An open – access publication

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ROMJIST is a publication of Romanian Academy,
Section for Information Science and Technology

Editor – in – Chief:
Radu-Emil Precup

Honorary Co-Editors-in-Chief:
Horia-Nicolai Teodorescu
Gheorghe Stefan

Secretariate (office):
Adriana Apostol
Adress for correspondence: romjist@nano-link.net (after 1st of January, 2019)

Founding Editor-in-Chief
(until 10th of February, 2021):
Dan Dascalu

Editing of the printed version: Mihaela Marian (Publishing House of the Romanian Academy, Bucharest)

Technical editor
of the on-line version:
Lucian Milea (University POLITEHNICA of Bucharest)

Sponsor:
• National Institute for R & D
in Microtechnologies
(IMT Bucharest), www.imt.ro

ROMJIST Volume 27, No. 2, 2024, pp. 241-251, DOI: 10.59277/ROMJIST.2024.2.10
 

Ionelia-Bianca BREZEANU, Silviu ISARI, Gheorghe BREZEANU
Improved Serial Peripheral Interface Controller Based on Scan Architecture

ABSTRACT: A high performance, digital serial controller having a self-test-based architecture is presented. A standard architecture able to achieve the targeted functionality was modified in order to contain the test mode circuitry for testability improvements. After the importance of creating digital architectures adapted for testability is underlined, we present the high frequency serial controller for analog switches. This block was adjusted for test reasons and implemented into a 3 V CMOS technology. The block is integrated together with input-output pad structures forming an entire chip structure for which the layout was implemented. Based on schematic design simulations, timing checks and defects analysis, the proposed architecture is confirmed.

KEYWORDS: Coverage; design for testability; digital controller; scan insertion; test mode.

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